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High-resolution spectral information enables phenotyping of leaf epicuticular wax in wheat.

Plant Methods 2021 Jun 7;17(1):58. Epub 2021 Jun 7.

Department of Soil and Crop Sciences, Texas A&M University, College Station, Texas, 77840, USA.

Background: Epicuticular wax (EW) is the first line of defense in plants for protection against biotic and abiotic factors in the environment. In wheat, EW is associated with resilience to heat and drought stress, however, the current limitations on phenotyping EW restrict the integration of this secondary trait into wheat breeding pipelines. In this study we evaluated the use of light reflectance as a proxy for EW load and developed an efficient indirect method for the selection of genotypes with high EW density. Read More

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