Pattern matching analysis of electron backscatter diffraction patterns for pattern centre, crystal orientation and absolute elastic strain determination - accuracy and precision assessment.

Authors:
Tomohito Tanaka
Tomohito Tanaka
Osaka Medical College
Angus J Wilkinson
Angus J Wilkinson
University of Oxford
United Kingdom

Ultramicroscopy 2019 Apr 15;202:87-99. Epub 2019 Apr 15.

Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK.

Pattern matching between target electron backscatter patterns (EBSPs) and dynamically simulated EBSPs was used to determine the pattern centre (PC) and crystal orientation, using a global optimisation algorithm. Systematic analysis of error and precision with this approach was carried out using dynamically simulated target EBSPs with known PC positions and orientations. Results showed that the error in determining the PC and orientation was <10 of pattern width and <0.01° respectively for the undistorted full resolution images (956 × 956 pixels). The introduction of noise, optical distortion and image binning was shown to have some influence on the error although better angular resolution was achieved with the pattern matching than using conventional Hough transform-based analysis. The accuracy of PC determination for the experimental case was explored using the High Resolution (HR-) EBSD method but using dynamically simulated EBSP as the reference pattern. This was demonstrated through a sample rotation experiment and strain analysis around an indent in interstitial free steel.

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Source
https://linkinghub.elsevier.com/retrieve/pii/S03043991183029
Publisher Site
http://dx.doi.org/10.1016/j.ultramic.2019.04.006DOI Listing
April 2019
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