Direct visualization of current-induced spin accumulation in topological insulators.

Nat Commun 2018 06 27;9(1):2492. Epub 2018 Jun 27.

Department of Electrical and Computer Engineering, National University of Singapore, Singapore, 117576, Singapore.

Charge-to-spin conversion in various materials is the key for the fundamental understanding of spin-orbitronics and efficient magnetization manipulation. Here we report the direct spatial imaging of current-induced spin accumulation at the channel edges of BiSe and BiSbTeSe topological insulators as well as Pt by a scanning photovoltage microscope at room temperature. The spin polarization is along the out-of-plane direction with opposite signs for the two channel edges. The accumulated spin direction reverses sign upon changing the current direction and the detected spin signal shows a linear dependence on the magnitude of currents, indicating that our observed phenomena are current-induced effects. The spin Hall angle of BiSe, BiSbTeSe, and Pt is determined to be 0.0085, 0.0616, and 0.0085, respectively. Our results open up the possibility of optically detecting the current-induced spin accumulations, and thus point towards a better understanding of the interaction between spins and circularly polarized light.

Download full-text PDF

Source
http://dx.doi.org/10.1038/s41467-018-04939-6DOI Listing
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC6021425PMC
June 2018
177 Reads

Publication Analysis

Top Keywords

current-induced spin
12
bise bisbtese
8
channel edges
8
topological insulators
8
spin accumulation
8
spin
7
direction reverses
4
opposite signs
4
direction opposite
4
possibility optically
4
open possibility
4
signs channel
4
spin direction
4
out-of-plane direction
4
accumulated spin
4
edges accumulated
4
temperature spin
4
microscope room
4
photovoltage microscope
4
spin accumulations
4

References

(Supplied by CrossRef)

MI Dyakonov et al.
Phys. Lett. A 1971

S Murakami et al.
Science 2003

S Zhang et al.
Phys. Rev. Lett. 2000

J Sinova et al.
Phys. Rev. Lett. 2004

JE Hirsch et al.
Phys. Rev. Lett. 1999

YK Kato et al.
Science 2004

V Sih et al.
Nat. Phys. 2005

YK Kato et al.
Phys. Rev. Lett. 2004

J Wunderlich et al.
Phys. Rev. Lett. 2005

K Nomura et al.
Phys. Rev. B 2005

H Zhao et al.
Phys. Rev. Lett. 2006

Similar Publications